FEI has updated its Xplore3D software package to include data acquisition and reconstruction for dual-axis electron tomography.
The new capability provides more complete information for the reconstruction of complex biological ultrastructure from high-resolution scanning/transmission electron microscopy (S/TEM).
Xplore3D's automation and precise specimen positioning capabilities allow users to automatically acquire tomography tilt series images from an initial tilt axis and a second tilt axis, after a sample rotation.
Acquiring tilt series from two axes enables users to gain more information from the sample, thereby minimising the 'missing wedge' problem common to all single tilt series tomography.
After automated dual-axis acquisition, Xplore3D also now enables automated dual-axis tomogram reconstruction.
Its dual-axis capability enables users to generate accurate tomograms.
Xplore3D is available now and integrated with FEI Tecnai and Titan Krios TEMs.
