Agar has announced the latest technical data is now available on Kleindiek Nanotechnik's In-Situ Lift-Out (INLO) Shuttle.
In-situ lift-out techniques are reliable methods for preparing samples requiring TEM and atom-probe inspection.
However, they are more expensive than ex-situ lift-out techniques and require valuable time on the FIB.
Kleindiek Nanotechnik's Lift-Out Shuttle decreases costs, increases sample throughput, reduces FIB time and produces reliable results.
The Lift-Out Shuttle has a diameter of 50mm and is compatible with the loadlock systems of most makes of SEM and FIB.
When used with Kleindiek's SEM-compatible glue, the Lift-Out Shuttle removes the need for gas precursors and eliminates sample contamination, such as that associated with ion beam induced deposition (IBID) techniques.
Operation is straightforward.
The Lift-Out Shuttle contains a microgripper that securely holds the pre-cut sample.
This allows the sample to be easily freed from the bulk material by simply dropping the substage.
This can be carried out ex situ with the help of a light microscope.
The whole assembly is then transferred to the vacuum-ready SEM or FIB via the loadlock.
The sample can now be attached to a holder (for example a TEM grid) using vacuum-compatible adhesive (SEMGLU), which is hardened under the electron beam.
These steps may be repeated for multiple samples, without breaking vacuum.
