Windsor Scientific has announced the launch of the next-generation Nanosurf scanning probe microscope (SPM), the Easyscan 2 FlexAFM.
The system brings new features to the Easyscan line of SPMs - adding operational modes as well as liquid imaging, while maintaining ease of use.
The FlexAFM's flexure-based electromagnetic XY scanner allows metrology-like applications in air or liquid, offering highly linear, ultra-flat, and fast scanning performance.
The introduction of Nanosurf's Surealign technology means that laser alignment is never needed - even when switching between ambient and liquid environments.
The top- and side-view optics offer the user a clear view of both and sample and probe, and the FlexAFM sample stage provides an easy way to position and approach substrates of various thickness and type, even samples in liquid containers, such as standard Petri dishes.
Additionally, the three levelling screws on the FlexAFM scan head maintain the scan head's capability to perform standalone measurements without a sample stage.
The high-quality scanning performance coupled with the ease-of-transfer from air to liquid environments makes the Nanosurf FlexAFM a versatile AFM system for a range of nanotechnology applications such as polymer science, coatings, semiconductors and other materials and life-science studies.