Jeol has developed two publications that explain the theory and operation of the scanning electron microscope (SEM) for routine imaging and elemental analysis.
These books, which can be downloaded from the company's website, are suitable for novice users of SEMs or anyone teaching basic SEM operation.
The first publication, entitled 'SEM: Scanning Electron Microscope A to Z - Basic Knowledge for Using the SEM', explains basic principals of operation, image display, the role of secondary and backscattered electron detectors and the vacuum system.
Further explanation of the SEM includes edge effect, the influence of accelerating voltage, the illumination effect of secondary and backscatter electron detectors, techniques for improving image resolution, the benefits of different types of electron guns, elemental analysis and sample preparation.
The second book, entitled 'SEM QandA', answers specific questions most often asked during demonstrations and training, such as how to mount powder samples, selecting the accelerating voltage and stereoscopic observation techniques.
These documents replace 'A Guide to Scanning' and 'Introduction to the SEM World'.
