Fischer Instrumentation is to showcase its MMS PC2 bench-top system, XDV-SD spectrometer and more at the Surface World Show on 27-29 October 2009.
The MMS PC2 bench-top system is multi-functional to suit a variety of applications and industries.
The XDV-SD spectrometer, originally developed for RoHS, is now naturally suited to gold- and precious-metal analysis and coating thickness measurement.
Fischer Instrumentation, the UK subsidiary of the Helmut Fischer Group, will also exhibit a range of coating thickness handheld gauges.
