Physik Instrumente (PI) will introduce the P-736 high-speed slide Z-scanner piezo stage at this year's Bios/Photonics West show.
The new nano piezo-Z stages are optimised for very fast step and settle and integration into high-resolution microscope applications.
They feature a low profile, a large aperture and travel ranges of up to 200um with sub-nanometre closed-loop resolution, which makes the stages suitable for microscopy and imaging applications.
The piezo stages are designed for inverted microscopes from Leica, Nikon, Olympus and Zeiss.
The low-profile design of 20mm (0.8in) facilitates integration, according to PI.
The large aperture accommodates microscopy accessories such as slide holders and Petri dish holders.
Features include: a fast step and settle, from 5ms; cost-effective piezo-resistive sensors; an optional 25 x 25mm long travel stage, which serves as a stable basis; simple integration; 100um and 200um travel ranges; ceramic encapsulated Picma piezo technology; compatibility with image acquisition software packages; closed-loop control for high repeatability and accuracy; and a digital piezo controller and software.
The compact digital piezo controller improves linearity and enables fast adaptation to changing load/settling/speed requirements and tuning from the controlling computer.
It comes with three interfaces (USB, analogue and RS-232) for compatibility with different control signals.
The controller is also compatible with all image acquisition packages and comes with a variety of software drivers and programming examples.
