Specialists from Malvern Instruments are to take part in the Pittcon 2010 technical programme across multiple disciplines with a series of podium and poster presentations.
At the event, which will take place from 28 February until 5 March 2010 in Orlando, Florida, there will be two presentations that will discuss the laser-diffraction technique for particle-size analysis.
Making a podium presentation, applications manager Dr Alan Rawle will consider the requirements for optical model selection when using laser diffraction, making reference to ISO-13320:2009, the updated standard for laser-diffraction measurements.
His talk will consider the importance of particle optical properties in defining the limits of the applicability of the available models, showing how particle absorption is important in guiding users towards a correct selection.
Rawle will present experimental data to illustrate the application of each model, with the aim of helping users of this technique gain a greater understanding of its application in practice.
His presentation will take place at 14:00 on 4 March in Room 308A (3090-1).
In a poster presentation - entitled 'Particle Size: Laser Diffraction Versus Dynamic Light Scattering'- on the same day, Dr Kapeeleshwar Krishana, applications scientist at Malvern Instruments, will compare the dynamic ranges for both techniques, providing a realistic assessment of the capabilities and limitations of each.
This type of understanding is essential in selecting the most appropriate technique for specific particle-sizing applications.
