Agar Scientific has launched its latest catalogue of accessories for electron, light, and scanning probe microscopy at the Microscience 2010 event.
In addition to the traditional items expected in the consumables and accessories catalogue, Agar has introduced new sections dedicated to some of microscopy's growth applications areas.
The mounting of samples is vital to the production of high-quality images.
Agar offers products from TEM Windows including transmission electron microscopy windows that enable the characterisation of nanomaterials by incorporating MEMS and thin-film technologies.
The Nanomill 1040 from Fischione Instruments enables the preparation of high-quality samples using a small-diameter, inert gas ion beam combined with low-energy and low-temperature operation.
The importance of sample positioning is reflected in the range of micro- and nano-positioning systems available from Kleindiek Nanotechnik.
Agar Scientific said another new section of its catalogue is dedicated to focused ion beam consumables.
Omniprobe provides a range of consumables specifically tailored to the production of high-quality TEM sample preparation inside the FIB.
The range includes sample holders, grid and sample holders combined, and probe tip holders.
For a free copy of the catalogue, register at the Agar Scientific website.
