The organisers of the Particle Summit, set to take place on 20-21 October 2010 in Cambridge, MA, have announced two further speakers for the event from Panalytical and Malvern Instruments.
The Particle Summit is sponsored by Malvern Instruments.
Dr Joerg Bolze from Panalytical will discuss 'Nanoparticle Size Distribution Determination by Small-Angle X-Ray Scattering on a Multi-Purpose X-Ray Diffractometer Platform'.
He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders and nano-composites.
In addition, Alon Vaisman from Malvern Instruments will present 'Particle Sizing - A Proven Technology for Process Control', in which he will describe how implementing on-line laser diffraction and real-time process control can maximise efficiency and eliminate out-of-spec production.
These additions to the programme bring the number of speakers over the two days to 17, who between them will cover a range of particle characterisation topics and technologies.
The event also features an optional pre-conference workshop on 19 October where participants can learn or refresh their knowledge of the basic principles of particle characterisation.
