WITec has launched True Surface Microscopy, a topographic imaging mode with integrated sensor for optical profilometry, allowing confocal Raman imaging along heavily inclined or very rough samples.
True Surface Microscopy is suitable for many applications, including the characterisation of micromechanical, medical, or semiconductor devices, the mapping of functionalised surfaces, or the imaging of bio-medical or pharmaceutical material surface properties.
Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data.
This allows confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality.
Samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterised as they are.
Complete system control as well as extensive data evaluation are integrated within the WITec Control and WITec Project software environment.
The profilometry capabilities of True Surface Imaging mode allows scan ranges of up to 100 x 100mm with a spatial resolution on the order of 100nm vertically and 10um laterally.
Measuring distances of 10mm and more provide flexibility for variable sample-size requirements.
In combination with AFM, the profilometer can even be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples.
