At the Particulate Systems Analysis 2011 Conference and Exhibition, Whitehouse staff will present papers on recent applications in particulates analysis for the pre-lunchtime session on 5 September.
'Production and characterisation of high resolution particle size reference standards' will be presented by Dr Graham Rideal (chief executive officer); 'Single parameter sieve certification using precision glass microspheres' by Jamie Storey (managing director) and 'Image analysis - overlooked parameters can significantly affect the results' by Keith Brocklehurst (senior scientist).
Whitehouse Scientific will also preview two products at the associated exhibition: the new Shapesizer image-analysis system and an improved range of silver-coated opaque particle-sizing standards.
The new Shapesizer is an image-analysis system from Whitehouse Scientific originally designed for certifying BCR reference microspheres.
The addition of a CCD camera, computer and software means that the system can be used in a variety of industrial particulate applications where both size and shape are critical particle-size parameters.
Whitehouse Scientific's new opaque standard covers the range from 10-100um.
The PSA 2011 Conference and Exhibition will be held on 5-7 September 2011 at the Hilton Grosvenor Hotel in Edinburgh.
