Thermal test enclosure range claims to provide accurate testing of temperature sensitive electronic products.
Available in either clamshell or hood configurations, SP Scientific thermal test enclosures may be used to isolate a device under test (DUT) at a precise temperature insulated from external conditions.
Features include:
- Uniform stable temperature with real-time thermal measurements on a device under test
- Temperature testing of a variety of device sizes into almost any test set-up, enabling characterisation, qualification, and fault isolation on components or production level testing
- All thermal test enclosures are electrostatic discharge (ESD)-free and/or electromagnetic interference (EMI) shielded.
- Enhanced data logging capabilities that allow the system to be used for device characterisation through advanced trending and data analysis
- The system also allows easy data transfer to a PC using a USB
When partnered with the ThermoJet ES, the thermal enclosures claim to provide engineers and researchers with an accurate, productive, and flexible tool for thermal testing or temperature cycling of a wide range of electronic components, wafers, hybrids, IC’s and other devices at precisely controlled temperatures.
The ThermoJet ES and thermal enclosure combination also provides testing of larger components and DUTs to help increase throughput and productivity, with temperatures ranging from -80°C to 225°C.
