Malvern Instruments is exhibiting its NanoSight Nanoparticle Tracking Analysis (NTA) systems at Pittcon 2014.
NTA systems will be on show alongside the Zetasizer Nano and the Viscotek SEC-MALS 20 GPC/SEC detector.
Malvern will also showcase its Mastersizer 3000 laser diffraction particle size analyser which features the latest software.
Malvern has stated that its system can now mimic the performance of other laser diffraction systems so that upgrading from one instrument to another is not complicated by having to rationalise any observed differences in the measured data.
Live analysis confirms the stability of measurements while in progress, and the ability to customise reports enables users to easily meet industry and company standards.
Malvern specialists will also run a number of events as part of the Pittcon short-course programme.
Pittcon 2014, March 2-6, McCormick Place, Chicago, USA.
