Novel x-ray spectrometer gives combined coating thickness measurement and materials analysis, without the need for special sample preparation
Innovative software combined with new hardware in the Fischer XDAL spectrometer enables fully automatic analysis of very thin multi-coated products as well as the analysis of solid, powder or liquid materials.
The product has been developed by Fischer Instrumentation (GB), long active in the field of non destructive coating thickness measurement and materials testing.
This new instrument has a novel construction so that a fully programmable XY table is incorporated for the analysis of multiple samples completely automatically.
The measurements are made in free air, no special preparation is required and cooling is achieved electronically with a Peltier device.
No longer do specimens have to be specially prepared; neither does the measurement need to be made in a vacuum with liquid nitrogen used to cool the detection device What gives the real power to the new design is the revolutionary new software.
This is the next generation of the Fischer Fundamental Parameter X-ray software.
The software allows, for example, the quantitative analysis of materials, consisting of up to 24 elements (from aluminium to uranium). Furthermore, it enables the measurement of even the individual coating thickness of coating systems, consisting of up to 24 different layers.
Also under certain conditions, individual elements may even be present many times in the different layers of coating.
The instrument is finding uses in the electronics industry for analysis of complex components, in jewellery assay work, where it can identify pure gold layers over lower carat bases and in general analytical laboratories
