Technique for rapid scanning fluorescence spectrophotometer reveals second and third order scattering of the primary excitation beam, as well as Raman scattering
A new 3D scanning option for the FL Solutions control software for the F-2500 rapid scanning fluorescence spectrophotometer has been introduced by Hitachi High-Technologies.
3-D scanning can be used as a rapid identification, or 'fingerprinting' technique.
The F-2500 offers scanning rates of 3000 nm/minute and slew rates of 12,000 nm/minute, allowing rapid acquisition of fluorescence data as a function of excitation wavelength and emission wavelength.
The information is presented in the form of a contour map, where the contour lines represent regions of the same fluorescence intensity.
The new software option provides exceptionally useful displays of data acquired during 3D scanning experiments, with simultaneous display of contour maps and excitation and emission spectra from any position on the scan. Traditional contour maps can also be displayed alongside a 'bird's eye' view of the contour, showing the peaks and valleys.
Another new feature allows arithmetic subtraction of contour maps from different samples to allow differences to be displayed.
The 3D technique readily reveals second and third order scattering of the primary excitation beam, as well as Raman scattering since scattered light appears as the diagonal 'straight' lines whereas the characteristic circles are a result of genuine fluorescence.
For even faster fingerprinting the 3-D scanning software is supplied as standard on Hitachi's F-4500 fluorescence spectrophotometer which offers scan rates of 30,000 nm/min, slew rates of 60,000 nm/min and data sampling rates as short as 1 millisecond.
