Horiba Jobin Yvon introduces the unique MM-16 spectroscopic ellipsometer to its line of metrology tools for the characterisation of a broad range of materials and thin films
Classical ellipsometers are limited in terms of the materials they can measure as they only measure a very limited subset of the optical information from a thin film structure.
By measuring the complete 16-element Mueller Matrix in less than two seconds the MM-16 removes this restriction and is able to determine the thickness and optical constants for birefringent materials and inhomogeneous sample layers in addition to simple thin film structures by classical ellipsometry, all with high accuracy.
All of this performance is available in an instrument that is very simple to operate, and at a very competitive price.
