Any compound optical microscope can now be computer controlled to provide extended sample scanning where large traverse high resolution digital imaging may be required
Any compound optical microscope can now be computer controlled to provide extended sample scanning where large traverse high resolution digital imaging may be required, through the application of mosaic automation systems to a location accuracy of 0.1 microns.
Dynamic auto-sensing of focus and correction is also provided for optimum results.
Also newly available is focus stack integration and multiple point time lapse imaging.
Applications for these techniques include micro-engineering, histology, fluidics, micro-geology and semiconductor diagnostics.
Trial samples are welcomed at the applications laboratory of Cambridge Technology Systems where confidential results can be provided without charge together with system engineering advice if required.
Hardware and software extensions to existing microscopes are available, or alternatively complete systems incorporating a new microscope of the user's choice engineer installation and operator training is also available in support of these systems.
Further information may be obtained by contacting Cambridge Technology Systems.
