Asylum Research has announced the contact resonance viscoelastic mapping mode (CRVMM) option available for its Cypher & MFP-3D atomic force microscopes (AFMs).
Contact Resonance (CR) enables high resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus.
The technique is particularly well suited for characterising moderate to high modulus materials in the range of about 1GPa to 200GPA for materials such as composites, thin films, biomaterials, polymer blends, and even ceramics and metals.
“An important feature of contact resonance imaging is that it characterises the full viscoelastic response of materials,” said Roger Proksch, president and co-founder of Asylum Research.
Highly damped cantilever and sample actuators were developed for both the MFP-3D and Cypher AFMs to provide clean, wideband excitation that makes operation far more robust and accurate.
Dual AC resonance tracking (DART) and band excitation electronics make it possible to rapidly measure both the contact resonance frequency and quality factor, providing measures of both the elastic and viscous responses at higher speeds.
The contact resonance packages are available for both new MFP-3D and Cypher S AFM systems and as upgrades to existing systems.
