Advanced film thickness measurement provides rapid and detailed analysis of virtually any translucent multi-layer film or laminate
Lumetrics has introduced an off-line scanning system combined with its Optigauge film thickness measurement system.
Optigauge has been combined with a scanning system to provide extremely rapid, yet detailed analysis of complex film compositions. Optigauge employs optical technology to measure absolute thickness to an accuracy of +/-0.1 micrometer (+/-0.004mil), a specification guaranteed by continuous calibration with a built-in reference standard.
Virtually any translucent multi-layer film or laminate can be analysed in detail, because the thickness of every layer is measured simultaneously, says Lumetrics.
Advanced designs of speciality films and packaging have led to the need for better measurement tools to confirm critical parameters such as film thickness.
Traditional lab techniques for measuring film thickness such as slicing and microscopy, destructive disassembling of films, and weight-based measurements are all slow and too dependent on individual interpretation.
The Optigauge system is said to be rapid and easy to use.
At the touch of a button, the system measures the material and provides the user with the results.
The system displays the results in graphical form and stores the data for easy download to any statistics program.
"The Optigauge system has shown tremendous savings for our users," said John Hart, president and CEO of Lumetrics.
"One customer was able to show a return on investment of under one year based solely on cost savings from faster incoming inspection.
"The simplicity of the scanning system also provides consistency from operator to operator.
"The end result is a better product at less cost to the end customer."
