Thermo Fisher Scientific has unveiled a new and improved large-area UltraDry silicon drift detector for electron microscopes
The UltraDry detector has enhanced capabilities allowing for detection of very low energy X-rays down to Beryllium.
The new detector will be showcased on the Thermo Scientific booth 1712 at Microscopy and Microanalysis 2007.
Enhancements to the silicon drift sensor in the new UltraDry detector make low energy detection performance possible.
The resulting clear peak separations in the low energy region allow for easier interpretation of spectra and exceptional confidence in the analysis.
As a silicon drift detector, the UltraDry has X-ray detection performance that is able to collect data at extremely high count rates without sacrificing energy resolution or light element sensitivity.
The UltraDry detector, coupled with the NORAN System SIX and Direct-to-Phase (DTP) software, enables the quick and accurate determination of compounds and identification of where they are located within the sample.
The NORAN System SIX microanalysis system, featuring the silicon drift detectors, addresses the needs of the electron microscopist in the area of microelectronics and semiconductor manufacture, alloys and metals analysis, geology, forensic science, failure analysis and academic research.
For more information on the Thermo Scientific NORAN System SIX ultra-fast X-ray microanalysis system, please visit booth 1712 at Microscopy and Microanalysis 2007, Broward County Convention Center, Florida, USA, August 5-9, 2007.
