Gatan has introduced the Ilion+, a dedicated ion-beam-based system for the preparation of large area planar cross-sections from challenging SEM samples.
The company said the system represents a significant advance in the preparation of large planar cross-sections for microscopic imaging and microanalysis.
The Ilion+ uses a proprietary milling system that is claimed to expose greater areas than traditional FIB milling while encompassing a wider range of delicate samples not compatible with mechanical polishing and other techniques.
The system is easy to install and operate, allowing users to begin making samples quickly.
The Ilion+ design is based on the Gatan PIPS (Precision Ion Polishing System).
