The new stage gives increased specimen movement to 40mm in both X and Y directions, giving an increased specimen coverage of 220% compared to the previous model
A new specimen stage has been introduced for the S-2600N variable pressure scanning electron microscope (SEM) from Hitachi High-Technologies.
The new stage gives increased specimen movement to 40mm in both X and Y directions, giving an increased specimen coverage of 220% compared to the previous model.
The stage also benefits from Z movement from 5-35 mm, tilt of -20deg to + 90deg and rotation of 360deg.
The new stage will greatly enhance the range of samples that can be examined by the versatile S-2600N.
This entry-level variable pressure system provides the capability to observe and capture SEM images of non-conducting and/or hydrated samples without preparation.
The elimination of sample preparation not only saves time and money but also prevents artifacts being introduced into the images.
The S-2600N is designed for both novice operators and experienced users.
The microscope features an intelligent software interface which guides operators from the first step of selecting the proper operating conditions through to the final step of image acquisition.
The instrument offers high vacuum resolution of 4.0nm and variable pressure resolution of 5.0nm.
