Modules double the available sample rate and memory depth of digitiser and arbitrary waveform generator product families
National Instruments has announced two 200MS/s modular instruments that extend the company's mixed-signal measurement capabilities.
The new modules, based on the company's Synchronisation and Memory Core (SMC), double the available sample rate and memory depth of the company's digitiser and arbitrary waveform generator product families.
When combined with National Instruments precision DC, RF and high-speed digital PXI instruments, the new modules are ideal for a variety of applications in consumer electronics, semiconductor, military/avionics and scientific research.
"Due to increasing production throughput and better accuracy requirements, we chose National Instruments modular instrumentation along with Microlex Systems Videomaster software for our camera test and calibration", said Deepak Murji, senior test engineer for Baxall.
"Based on our extensive evaluation and the comparison to traditional test methods, we can obtain more than 25% higher throughput and calibrate our products with higher accuracy".
The NI PXI-5124 12-bit, dual-channel digitiser and the NI PXI-5422 16-bit arbitrary waveform generator use the latest commercial semiconductors to extend the SMC architecture by increasing sample rates to 200MS/s and memory depth to 512MB per channel.
The new modules bring the advantages of NI modular instruments to an even broader set of applications by delivering world-class accuracy, flexibility and tight integration of mixed-signal I/O, says the company.
The PXI-5124 digitiser offers 75dBc spurious-free dynamic range (SFDR) and 150MHz bandwidth, while the PXI-5422 arbitrary waveform generator delivers less than 6% pulse aberration and a 1.8 nanosecond rise time.
Design and test engineers can use the new 200MS/s digitiser and arbitrary waveform generator to quickly build stimulus/response systems at any time during a product's development cycle using the new NI SignalExpress interactive measurement software as well as Labview 7.1 and NI TestStand test management software.
With the Express technology available in each of these software packages, engineers can interactively configure the digitiser and arbitrary waveform generator with little programming, offering much faster system setup.
Engineers can customise their measurement systems with the more than 400 measurement and analysis functions including spectral measurements and analogue and digital modulation available in Labview 7.1.
All NI mixed-signal modular instruments are built on the common SMC architecture, so they tightly synchronise with other SMC-based instruments, such as the NI PXI-6552 100 MHz digital waveform generator/analyser.
With module-to-module jitter of less than 20 picoseconds RMS, the synchronisation of the SMC makes high-performance mixed-signal or high-channel-count measurement systems possible.
In addition, both new modules can import external sample clocks, reference clocks and triggers through front panel connectors or the PXI trigger bus.
