Unlike older XRD detector technologies, this deviced measures the 2D X-ray diffraction pattern from a sample to allow for the calculation of of physical parameters in a broad range of sample types
Bruker AXS reports that R and D Magazine has selected its Vantec-2000 detector for a 2005 R and D 100 Award, which recognises the most technologically significant products introduced into the marketplace during the past year.
"Since its introduction, the Vantec-2000 has dramatically boosted the performance of X-ray diffraction (XRD) detectors for materials research.
"It combines low noise, high sensitivity, excellent spatial resolution and dynamic range with real-time data acquisition.
"This even allows for snapshot and movie mode acquisition in a virtually maintenance-free detector, that is unrivalled in the XRD marketplace," stated Uwe Preckwinkel, the Bruker AXS US XRD product manager.
Unlike older XRD detector technologies, the Vantec-2000 measures the two-dimensional X-ray diffraction pattern from a sample.
The result allows for the calculation of a wide variety of physical parameters in a broad range of sample types.
Because of its unique capability to detect individual photons at up to two million counts per second, the detector is said to be ideal for the analysis of weakly and/or strongly scattering samples - including smallest sample traces, single crystals, epitaxial thin films, coatings, rocks, polymers, metals, steel, wood, plastics, liquids, nanomaterials and more.
The award, selected by an independent panel of judges and the editors of R and D Magazine, "provides a mark of excellence known to industry, government, and academia as proof that the product is one of the most innovative ideas of the year", explained the magazine's editor-in-chief, Tim Studt.
