Attenuated total reflectance (ATR) microscope objective performs micro-ATR analysis of inclusions, surfaces and samples inside depressions with no need for sample preparation
Thermo Electron announces the launch of its new Slide-On attenuated total reflectance (ATR) microscope objective, the only one of its kind able to collect data from samples between obstacles, thanks to its conical crystal shape.
Traditional methods analyse only samples of certain flatness.
The new Tip ATR is designed to analyse more challenging samples in analytical services laboratories, forensic laboratories and research institutes.
The new Slide-On ATR microscope objective performs micro-ATR analysis of inclusions, surfaces and samples inside depressions with no need for sample preparation.
Furthermore, it does not require additional optics for reflection and transmission analysis.
The ability to analyse recessed data provides technology that is particularly significant for specialist applications such as direct analysis and defect analysis of artwork restoration, forensic/fibres and microelectronics.
The novel Slide-On ATR objective allows sample position reproducibility, depth profile studies and ATR surveys.
It is easy to clean, thereby avoiding cross-contamination and is equipped with cost effective crystals that can be easily removed and replaced.
In addition, the Tip ATR features an infinity corrected optical design and proprietary spherical aberration compensation.
Moreover, the depth of penetration offered by this new technology is the highest in the Slide-On crystal family providing high signal-to-noise ratio even with the smallest sample areas.
Thermo offers its Noran line of precision analytical X-ray instrumentation for materials analysis in research, failure analysis and quality control applications, elemental and compound information at microscopic and macroscopic levels with x-ray microanalysis (EDS/WDS/EBSD) and X-ray fluorescence (EDXRF) products.
