All Electron microscopy systems
Convert high voltages for electron microscopy
SDS Systems Development and Solutions | Added: 6 Jun 2005
Ultra-miniature DC modules are fitted in small housings that can be soldered directly to printed ci…
Five-segment BSD for variable pressure SEM
Hitachi High Technologies | Added: 20 May 2005
High sensitivity allows smaller spot sizes and beam currents to be used in BSD imaging leading to i…
X-ray detector delivers unique thin film analysis
Thermo Fisher Scientific (Microanalysis) | Added: 19 May 2005
Microbeam X-ray fluorescence metrology systems enable an unprecedented level of analysis for thin f…
Laser boosts atom probe power
Oxford Nanoscience | Added: 6 May 2005
Technology allows the evaporation, counting, identification and spatial location of individual atom…
Atom probe is highly sensitive
Oxford Nanoscience | Added: 15 Apr 2005
The extremely narrow peaks produced and high signal-to-noise ratio allow accurate chemical analysis…
Why use a Stem and not a Tem?
Hitachi High Technologies | Added: 15 Apr 2005
Two new application notes for scanning transmission electron microscopy compare the performance of …
Breaking electron microscopy resolution barriers
Hitachi High Technologies | Added: 9 Mar 2005
This in-lens scanning electron microscope claims previously unobtainable resolutions of 0.4nm at 30…
New head for process development and applications
Oxford Nanoscience | Added: 17 Feb 2005
Peter Clifton joins Oxford Nanoscience from Seagate Technology, where he had been responsible for a…
Improved display facilities for VPSEM
Hitachi High Technologies | Added: 7 Feb 2005
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Tech…
Half a century of scanning electron microscopy
Carl Zeiss Microscopy GmbH | Added: 23 Dec 2004
Achievements of Cambridge University engineering department and the Cambridge Instrument Company, n…
First atom probe sale in China
Oxford Nanoscience | Added: 15 Dec 2004
Instrument provides materials scientists with the ability to simultaneously determine the spatial p…
Atom probe wins measurement award
Oxford Nanoscience | Added: 8 Dec 2004
The 3DAP was developed in the materials department of Oxford University by Professors Alfred Cerezo…
TEM has ultra-high sensitivity
Hitachi High Technologies | Added: 22 Nov 2004
This ultra-high sensitivity digital imaging transmission electron microscope offers sensitivity app…
VPSEM promises outstanding performance
Hitachi High Technologies | Added: 11 Oct 2004
Variable pressure scanning electron microscope has new electron optics, detector, pumping system an…
Sales of 3D atom probes to Japan
Oxford Nanoscience | Added: 11 Oct 2004
Oxford Nanoscience announces continuing success in the sale of its 3DAP thtree-dimensional atom pro…
Catalysis cell for 3D atom probe
Oxford Nanoscience | Added: 31 Aug 2004
Oxford Nanoscience has announced the availability of a new accessory for the 3DAP three-dimensional…
Versatility in microscopy analysis
Hitachi High Technologies | Added: 12 Aug 2004
Instrument claims outstanding analysis capabilities on field emission variable pressure scanning el…
Award for new direction in atomic force microscopy
Molecular Imaging | Added: 30 Jul 2004
Said to be the only commercially available instrument to add real-time, simultaneous topography and…
X-ray microanalysis improvements
Thermo Fisher Scientific (Microanalysis) | Added: 28 Jul 2004
New products and software introduce significant advancements for analytical methods and dramaticall…
Nanometre spatial resolution with Stem
Hitachi High Technologies | Added: 28 Jul 2004
Scanning transmission electron microscope offers outstanding mapping and analysis through electron …
