All Electron microscopy systems
Expansion of electron microscope sales area
Hitachi High Technologies | Added: 21 Mar 2006
Hitachi High-Technologies has announced a major expansion in sales territories for its electron mic…
Automated 3D crystallography featured at Pittcon
FEI | Added: 15 Mar 2006
At Pittcon 2006, FEI is featuring its EBS3 DualBeam system for rapid serial sectioning and 3D cryst…
BASF chooses FEI system for nanoparticle R+D
FEI | Added: 7 Mar 2006
The Strata 400 will be utilised in BASF laboratories, along with previously installed FEI Tecnai tr…
FEI sponsors 2006 safer nano conference
FEI | Added: 6 Mar 2006
Advanced detection and analysis, coupled with proactive industry education, can pave the way for a …
Ultra-fast and sensitive SDD detector-based EDS
Bruker Daltonik GmbH | Added: 21 Feb 2006
Quantax Quad features the unique XFlash Quad detector - the first four-channel 40mm2 silicon drift …
TEM for high throughput comes to Europe
Hitachi High Technologies | Added: 8 Feb 2006
The PC-controlled H-9500 transmission electron microscope (TEM) from Hitachi High-Technologies is n…
FEI's Titan S/Tem receives industry honours
FEI | Added: 7 Feb 2006
Titan scanning transmission electron microscope (S/Tem), the world's most powerful commercially-ava…
Anisotropic etching parallel plate plasma etcher
SPI Supplies | Added: 4 Jan 2006
Designed for removal of passivation layer from an electronic device, and when the lines are below a…
Osmium coating for electron microscopy
SPI Supplies | Added: 3 Jan 2006
SPI Supplies is the worldwide distributor (outside of Japan) for the line of OPC Osmium Plasma Coat…
Electron microscopy films at half price
SPI Supplies | Added: 2 Jan 2006
Maco electron microscope films have been introduced to the electron microscope market as direct rep…
MRam manufacturers turning towards laser 3DAP
Oxford Nanoscience | Added: 21 Dec 2005
Developers of magnetoresistive random access memory are taking a interest in the Laser Three Dimens…
Molecular imaging acquired by Agilent
Molecular Imaging | Added: 29 Nov 2005
Acquisition marks the next step in strengthening Agilent's market position in nanomeasurement by ex…
Greater sampling volume for 3D atom probe
Oxford Nanoscience | Added: 11 Nov 2005
Field of view has been increased by approximately 2.5 times compared to previous versions of the in…
New secondary electron detector for S-3400N
Hitachi High Technologies | Added: 11 Nov 2005
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for…
3DAP wins another award
Oxford Nanoscience | Added: 24 Oct 2005
Three-Dimensional Atom Probe (3DAP) from Oxford Nanoscience has been announced as the winner of the…
TEM demonstration system in the UK
Hitachi High Technologies | Added: 10 Oct 2005
Hitachi High-Technologies has announced that the H-7650 ultra-high sensitivity digital imaging TEM …
Scanning atom probe is under development
Oxford Nanoscience | Added: 6 Sep 2005
Next-generation instrument, developed through a DTi-funded Link project, will be used to correlate …
High temperature accessory for Stem
Hitachi High Technologies | Added: 8 Aug 2005
Specimen holder for high resolution scanning transmission electron microscope enables atomic behavi…
Sputter profiling for SEM surface analysis
Thermo Fisher Scientific (Microanalysis) | Added: 15 Jul 2005
Faraday Plate Imaging package as an optional extra to supplement ion gun component package enables …
Probes for scanning electrochemical microscope
Trogone Instruments | Added: 16 Jun 2005
Innovative design of the scanning head coupled with the enhanced specifications of the bi-potentios…
