Panalytical will launch Omnian, its non-standard XRF analysis package, and will present a range of X-ray fluorescence (XRF) spectrometry and X-ray diffraction (XRD) solutions at Pittcon 2009.
Visitors to booth 1703/1803 can explore Panalytical's systems using 3D interactive product simulations.
Panalytical experts will be on hand to demonstrate the products, including improved industrial process optimisation and environmental monitoring.
Lab personnel from petrochemical, mining and metals industries will find areas dedicated to the latest developments in their fields.
The company's Axios WDXRF system will also be on display.
The Omnian non-standard XRF analysis package is designed for rapid quantification of unknown samples or for situations where certified standards that match specific sample characteristics are not available.
Important applications include sample screening and failure analysis, as well as the comparison of different materials.
The Axios Fast simultaneous XRF system will be on show as a 3D interactive product model.
Axios Fast is equipped with Panalytical's SST-max X-ray tube, which uses Zeta technology to eliminate the effects of X-ray tube aging on intensity.
The X'Pert Pro MPD will also feature as part of the interactive display.
The latest application advances in small-angle X-ray scattering (SAXS), pair-distribution function (PDF), transmission, and non-ambient solutions will all be presented.
In addition, Panalytical's latest technology in XRF and XRD tubes will be demonstrated.
Designed for a wide range of demanding applications, these tubes offer improved eco-friendliness and full ROHS and WEEE compliance.
Panalytical's booth will also feature a small theatre area, with a rotating schedule of 10-15 minute mini-seminars on solutions and products.
