FEI has announced the Phenom Remote Assistant, a service enhancement that allows remote tracking, diagnostics and repair of Phenom personal scanning electron microscope (SEM) systems.
'Phenom Remote Assistant enhances productivity by providing reduced time to repair, and increased reliability and uptime of the system,' said Paul Scagnetti, FEI's Industry Division vice-president and general manager.
'Our customers can anticipate service problems before they arise and resolve them with the help of FEI service engineers remotely.' The Phenom Remote Assistant is powered by RAPID (remote access program for interactive diagnostics), FEI's secure infrastructure for remote diagnostics.
RAPID provides a highly secure, encrypted, VPN (virtual private network) connection between the customer and FEI service engineer.
All remote connections are initiated from the Phenom side, so the customer is always in control.
Phenom Remote Assistant reduces the likelihood that customers will have to take a Phenom off-line and return it to the service centre.
FEI service engineers can remotely track key performance metrics over time, run service test diagnostics on the system, check and modify tool settings, and even view microscope images to access quality and provide expert operations advice.
The Phenom Remote Assistant is available at no additional charge with all Phenom personal SEMs.
It is an imaging tool that makes high-end imaging practical and affordable for educational use, as well as a variety of industrial applications.
It combines light optical and electron optical technologies in an integrated microscope system.
Offering magnification of up to 24,000x and 30nm resolution (about 100,000 times smaller than the diameter of a human hair) in 30 seconds, the Phenom opens the door to the micro- and nanoscale worlds.
