All Electron microscopy systems
Collaborating with MPI on correlative microscopy
FEI | Added: 4 Aug 2008
Correlative microscopy, developed by Max Planck Institute (MPI) of Biochemistry, will be marketed a…
Electron microscope facility opens at Cavendish
Hitachi High Technologies | Added: 4 Aug 2008
Hitachi has opened a new Advanced Scanning Electron Microscope Facility in the Cavendish Laboratori…
Developing India's premier imaging facility
FEI | Added: 1 Aug 2008
India's International Centre for Material Science (ICMS) in Bangalore has selected FEI and its Mumb…
Jeol Introduces new thermal FE-SEM at M+M
Jeol USA | Added: 1 Aug 2008
Jeol USA will demonstrate a new high throughput thermal field emission (FEG) scanning electron micr…
FE multibeam added to Jeol's SEM/FIB lineup
Jeol USA | Added: 31 Jul 2008
Jeol USA will demonstrate both of its new multibeam SEM/FIB instruments in a special exhibit area d…
Remote microscopy demonstrated at M+M 2008
Jeol USA | Added: 31 Jul 2008
From the exhibition hall in Albuquerque, Jeol USA will demonstrate via remote operation three of it…
Software enhances TEM imaging and data acquisition
Jeol USA | Added: 30 Jul 2008
Jeol will demonstrate a variety of new software packages for its 120kV to 300kV series of transmiss…
Tutorial for practical remote in situ microscopy
Jeol USA | Added: 29 Jul 2008
Jeol USA will host a tutorial session at M+M 2008 in conjunction with Oak Ridge National Laboratory…
Connectivity improves and accelerates TEM Imaging
FEI | Added: 16 Jul 2008
By accelerating and improving the quality of preparation, imaging and analysis of the ultra-thin sa…
Atomic force microscope has large stage
Agilent Technologies Europe | Added: 15 Jul 2008
Agilent has announced the availability of the 5600LS, a high-resolution atomic force microscope tha…
A new category of scanning electron microscopy
FEI | Added: 8 Jul 2008
With its announcement of the Magellan family, FEI says it has introduced a new class of instruments…
ETEM for atomic scale chemical research
FEI | Added: 23 Jun 2008
Titan ETEM is intended for chemical research at the atomic scale, and is a significant advance for …
Clarion call for more powerful electron microscope
The Royal Microscopical Society | Added: 23 Jun 2008
At Microscience 2008, London, 24-26 June, further developments in this extraordinary new technique …
Perfect balance of analyser, detector and software
Thermo Fisher Scientific (Microanalysis) | Added: 6 Jun 2008
Equipped with a high throughput pulse processor, spectral imaging capability and a sophisticated so…
Shimadzu to sell FEI electron microscopes in Japan
Innovative Micro Technology | Added: 3 Jun 2008
FEI has selected Shimadzu, developer of analytical measuring and technology systems, as a sales age…
SU6600 is new variable pressure field emission SEM
Hitachi High Technologies | Added: 2 Jun 2008
Hitachi High-Technologies has announced the new SU6600 variable pressure field emission SEM, furthe…
Electron microscopes assist work at British Museum
Hitachi High Technologies | Added: 27 May 2008
Department of Conservation and Scientific Research at the British Museum has two Hitachi analytical…
Applications notebook for Accutof-Dart mass spec
Jeol USA | Added: 14 May 2008
Jeol USA has published the fourth edition of its popular collection of applications notes for open …
Hitachi expands its electron microscopy range
Hitachi High Technologies | Added: 23 Apr 2008
Hitachi High-Technologies is introducing two new additions to its rapidly expanding range of electr…
FEI and Imago in atom probe collaboration
FEI | Added: 16 Apr 2008
FEI and Imago Scientific Instruments announce a comprehensive collaboration on the distribution and…
