Latest Product Update
Atom probe is highly sensitive
Oxford Nanoscience | Added: 15 Apr 2005
The extremely narrow peaks produced and high signal-to-noise ratio allow accurate chemical analysis…
Why use a Stem and not a Tem?
Hitachi High Technologies | Added: 15 Apr 2005
Two new application notes for scanning transmission electron microscopy compare the performance of …
Breaking electron microscopy resolution barriers
Hitachi High Technologies | Added: 9 Mar 2005
This in-lens scanning electron microscope claims previously unobtainable resolutions of 0.4nm at 30…
Improved display facilities for VPSEM
Hitachi High Technologies | Added: 7 Feb 2005
The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Tech…
Atom probe wins measurement award
Oxford Nanoscience | Added: 8 Dec 2004
The 3DAP was developed in the materials department of Oxford University by Professors Alfred Cerezo…
TEM has ultra-high sensitivity
Hitachi High Technologies | Added: 22 Nov 2004
This ultra-high sensitivity digital imaging transmission electron microscope offers sensitivity app…
VPSEM promises outstanding performance
Hitachi High Technologies | Added: 11 Oct 2004
Variable pressure scanning electron microscope has new electron optics, detector, pumping system an…
Catalysis cell for 3D atom probe
Oxford Nanoscience | Added: 31 Aug 2004
Oxford Nanoscience has announced the availability of a new accessory for the 3DAP three-dimensional…
Versatility in microscopy analysis
Hitachi High Technologies | Added: 12 Aug 2004
Instrument claims outstanding analysis capabilities on field emission variable pressure scanning el…
Award for new direction in atomic force microscopy
Molecular Imaging | Added: 30 Jul 2004
Said to be the only commercially available instrument to add real-time, simultaneous topography and…
X-ray microanalysis improvements
Thermo Fisher Scientific (Microanalysis) | Added: 28 Jul 2004
New products and software introduce significant advancements for analytical methods and dramaticall…
Nanometre spatial resolution with Stem
Hitachi High Technologies | Added: 28 Jul 2004
Scanning transmission electron microscope offers outstanding mapping and analysis through electron …
Electron microscope for protein research
Delong Instruments | Added: 6 Jul 2004
Desktop instrument provides high resolution direct observation of protein preparations in native st…
Breakthrough in Fesem technology
Hitachi High Technologies | Added: 25 Jun 2004
Instrument combines large sample handling capabilities with the image resolution normally associate…
Resolution improvement by 30% for Fesem
Hitachi High Technologies | Added: 20 May 2004
Beam deceleration technology offers even better resolution capabilities at low accelerating voltage…
3D imaging at the nanoscale
Oxford Nanoscience | Added: 31 Mar 2004
Three-dimensional atomic probe imaging with chemical identification boosts materials characterisati…
Stem offers improved resolution
Hitachi High Technologies | Added: 30 Jan 2004
New scanning transmission electron microscope provides the capability for real-time element mapping…
Precision stage for AFM imaging
Molecular Imaging | Added: 12 Dec 2003
Extremely accurate positioning stage designed for use in surface characterisation of large samples …
TEM reaches 300kV in three minutes
Hitachi High Technologies | Added: 3 Nov 2003
High performance tunelling electron microscope uses a single crystal LaB6 electron source and offer…
Personal SEM in a box
Jencons-PLS | Added: 28 Oct 2003
Powerful yet cost effective 'personal' scanning electron microscope packed with features normally o…
