Latest Product Update
Combined EBSD and X-ray microanalysis solution
Thermo Fisher Scientific (Microanalysis) | Added: 17 Oct 2003
Cooperative agreement to combine electron backscatter diffraction system and X-ray microanalysis sy…
X-ray 'scope for fluorescence and transmission
null Horiba Jobin Yvon | Added: 14 Oct 2003
Unique combination of surface and transmission X-ray analysis provides a complete elemental charact…
Light at the end of the tunnel
Hitachi High Technologies | Added: 24 Sep 2003
New transmission detector for high resolution low voltage scanning tunnelling electron microscope g…
Ultra-high resolution field emission VPSEM
Hitachi High Technologies | Added: 9 Jul 2003
Field emission variable pressure scanning electron microscope combines the high resolution and imag…
Scanning electrochemical microscope
Uniscan Instruments | Added: 4 Jul 2003
Scanning micro-electrode workstation can be used to monitor or impose current flowing between a mic…
Desktop electron microscope
Delong Instruments | Added: 31 Mar 2003
Transmission and scanning electron microscope will be demonstrated at the Israel Society for Micros…
Host of applications for ESE detector
Hitachi High Technologies | Added: 5 Mar 2003
Allows imaging to take place as a result of a process involving the secondary electrons generated i…
A new breed of electron microscope
Delong Instruments | Added: 13 Jan 2003
Delong Instruments has unveiled the LVEM5, introducing what it says is a new breed of Electron Micr…
VPSEM for large samples
Hitachi High Technologies | Added: 15 Oct 2002
Scanning electron microscope is capable of handling specimens up to 254mm in diameter, 70mm in heig…
Ultra-high resolution Fesem for large samples
Hitachi High Technologies | Added: 26 Jun 2002
A new Fesem which combines the resolution capabilities normally associated with in-lens instruments…
Enhanced backscattered electron detection
Hitachi High Technologies | Added: 15 Apr 2002
Optional additional electron detector improves imaging versatility of scanning electron microscope,…
Improved scanning electron microscope
Hitachi High Technologies | Added: 25 Jan 2002
Hitachi High-Technologies has announced a number of improvements for the S-4700 field emission SEM,…
Low cost scanning electron microscope
Hitachi High Technologies | Added: 10 Aug 2001
Hitachi Scientific Instruments has launched the entry level S-2600N/H SEMs with the specific intent…
New autofocus TEM
Hitachi High Technologies | Added: 7 Aug 2001
Hitachi has announced a new high performance thermionic transmission electron microscope, offering …
New in-lens FESEM
Hitachi High Technologies | Added: 9 Jul 2001
Significantly improved resolution and imaging capabilities promised by new Windows NT-controlled S-…
