All Electron microscopy systems
Automated SEM analysis for minerals exploration
FEI | Added: 27 Mar 2007
The combined solution features FEI's Quanta SEM and JKTech's Mineral Liberation Analyzer software a…
Nano-DST: an advanced platform for AFM research
Pacific Nanotechnology | Added: 6 Mar 2007
Pacific Nanotechnology (PNI), having introduced the tabletop Nano-R AFM systems, now brings an adva…
3D nanoscale characterisation and analysis
FEI | Added: 21 Feb 2007
Quanta 3D FEG expands FEI's DualBeam portfolio; high-resolution, low-vacuum SEM/FIB DualBeam delive…
Three electron microscopes for UCLA
FEI | Added: 10 Jan 2007
The California NanoSystems Institute (CNSI) at UCLA has selected FEI for three advanced transmissio…
High performance Stem has new electron optics
Hitachi High Technologies | Added: 9 Jan 2007
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improve…
New capabilities for scanning electron microscopes
AP Technologies | Added: 4 Jan 2007
AP Technologies announces the new 3Max detector from El-Mul Technologies of Yavne, Israel, describe…
Tabletop microscopes on show at Buckingham Palace
Hitachi High Technologies | Added: 4 Dec 2006
Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum…
Major order from Technical University of Denmark
FEI | Added: 28 Nov 2006
Seven systems valued at US$11.5 million to form the core of DTU's new centre for electron nanoscopy…
U of Ulster opens centre for advanced imaging
FEI | Added: 26 Oct 2006
University of Ulster has opened the FEI Centre for Advanced Imaging in Northern Ireland, to provide…
Imperial College unveils UK's first Titan S/Tem
FEI | Added: 19 Oct 2006
World's most powerful commercially-available microscope provides access to atomic-scale data for na…
IMP opens new microscopy centre with FEI tools
FEI | Added: 4 Oct 2006
Mexico's national research petroleum institute, the Instituto Mexicano del Petroleo (IMP), will ope…
Programme for advanced nanoparticle analysis
FEI | Added: 13 Sep 2006
FEI's Quanta SEMs and Malvern's advanced particle analysis software combine to deliver ground-break…
Six awards in six years
Jeol USA | Added: 12 Sep 2006
For the sixth consecutive year, Jeol USA has received the Omega Northface Award in recognition for …
FEI receives Titan order from Japanese steelmaker
FEI | Added: 6 Sep 2006
Designed for dedicated correction and monochromator technology, the Titan S/Tem is the world's high…
Hitachi contributes to microscopy congress
Hitachi High Technologies | Added: 17 Aug 2006
Representatives will reinforce company's expertise in electron optics by making a significant contr…
Thermo upgrades its X-ray microanalysis system
Thermo Fisher Scientific (Microanalysis) | Added: 2 Aug 2006
Thermo Electron has improved its X-ray microanalysis system, Noran System Six, enabling superior pr…
Titan S/TEM achieves low kV milestone
FEI | Added: 1 Aug 2006
1.4 Angstrom resolution at the very low operating voltage of 80kV marks an important breakthrough f…
FEI launches top-of-line research dualbeam at M+M
FEI | Added: 1 Aug 2006
Helios NanoLab features ultra-high resolution field emission SEM column combined with Sidewinder FI…
Kania named president and CEO of FEI
FEI | Added: 27 Jul 2006
FEI announces today that Don R Kania has been named by the board of directors as president, chief e…
Complete nanoparticle characterisation wins fans
Pacific Nanotechnology | Added: 14 Jul 2006
Pacific Nanotechnology (PNI) reports that the first dedicated SPM system for the characterisation o…
