All Electron microscopy systems


Scientists map "most important" protein

Added: 21 Jul 2014

Understanding the secondary structure of the anaphase-promoting complex (APC/C) could lead to the d…

The Su8230 at Leeds University

Leeds extends microscopy capability

Hitachi High Technologies | Added: 16 Jun 2014

The University of Leeds Electron Microscopy and Spectrocopy Centre has extended its electron micros…

The Tecnai Femto is the first system to commercialise patented ultrafast electron microscopy technol

Ultrafast electron microscope

FEI | Added: 14 Nov 2013

FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…

ExSolve is designed to offer an automated, high-throughput sample preparation workflow for transmiss

High-throughput microscopy sample preparation

FEI | Added: 13 Nov 2013

ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…

The Helios NanoLab 660 DualBeam system

FEI to showcase Helios NanoLab 660

FEI | Added: 4 Jul 2013

FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…

Hitachi announces the SU8200 – a new type of cold field emitter SEM

Hitachi launches SU8200 series

Hitachi High Technologies | Added: 27 Jun 2013

Hitachi High-Technologies has released the innovative SU8200 series of cold field emitter SEMs worl…

Hitatchi TM3030

Hitachi launches table-top microscope

Hitachi High Technologies | Added: 31 May 2013

The 3rd generation TM3030 microscope is designed to provide better resolution when imaging at 5 kV.


Scientists discover structure of protein essential for quality control

Added: 15 Jan 2013

The Scripps Research Institute (TSRI) has pushed the boundaries of electron microscopy to determine…

Microscopy of Arabidopsis thaliana root tips cells

Leica Microsytems | Added: 19 Dec 2012

This technical note describes the preparation method for electron microscopy of high pressure subst…

Diamondoid crystals

Diamond-like coating improves electron microscope images

Added: 18 Dec 2012

Researchers have found that coating materials with diamond-like crystals greatly improves images of…

Scanning Electron Microscopy applied to porous materials

Jeol USA | Added: 31 Oct 2012

This document provides an appraisal of high resolution Scanning Electron Microscopy applied to poro…


Verios SEM delivers high resolution measurement

FEI | Added: 31 Jul 2012

SEM allows measurement of sensitive materials in semiconductor and materials applications.


NeoScope microscope delivers improved magnification

Jeol USA | Added: 12 Jul 2012

Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.


Ultra-high resolution analytical field emission SEM

Jeol USA | Added: 5 Jun 2012

High performance FE-SEM optimised for sub-nm resolution imaging of any type of sample

XFlash 6

Bruker's next generation EDS detectors

Bruker Nano Analytics | Added: 26 Apr 2012

Bruker has introduced XFlash 6, the next generation of silicon drift detectors (SDD) for energy dis…

Agilent's 'first-of-a-kind' ICP-MS device

Agilent Technologies | Added: 24 Jan 2012

Agilent says its 8800 triple quadrupole ICP-MS (ICP-QQQ) is the first such instrument.

Asylum AFMs perform advanced measurements

Asylum Research | Added: 25 Oct 2011

Asylum Research provides its MFP-3D and Cypher atomic force microscopes (AFMs) with capabilities th…

FEI offers mudlogging analysis for oil industry

FEI | Added: 20 Oct 2011

The Qemscan Wellsite analysis system from FEI is suitable for mudlogging services for the oils and …

Elliot offers microscope for forensic scientists

Elliot Scientific | Added: 5 Sep 2011

Elliot Scientific is now offering the Elixir microscope from Craic Technologies for the accurate an…

HT7700 allows analysis of light element materials

Hitachi High Technologies | Added: 18 Aug 2011

Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first t…