All Electron microscopy systems
![Researcher](/files/img_cache/5889/160_120_1Protein.jpg?1456223405)
Scientists map "most important" protein
Added: 21 Jul 2014
Understanding the secondary structure of the anaphase-promoting complex (APC/C) could lead to the d…
![The Su8230 at Leeds University](/files/img_cache/5739/160_120_1Su8230_AT_Leeds.jpg?1463133885)
Leeds extends microscopy capability
Hitachi High Technologies | Added: 16 Jun 2014
The University of Leeds Electron Microscopy and Spectrocopy Centre has extended its electron micros…
![The Tecnai Femto is the first system to commercialise patented ultrafast electron microscopy technol](/files/img_cache/5105/160_120_1Tecnai_Femto.jpg?1456223420)
Ultrafast electron microscope
FEI | Added: 14 Nov 2013
FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…
![ExSolve is designed to offer an automated, high-throughput sample preparation workflow for transmiss](/files/img_cache/5103/160_120_1ExSolve_WTP_Right_final.jpg?1463133885)
High-throughput microscopy sample preparation
FEI | Added: 13 Nov 2013
ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…
![The Helios NanoLab 660 DualBeam system](/files/img_cache/4626/160_120_1FEI-HeliosNanoLab-660.jpg?1456223400)
FEI to showcase Helios NanoLab 660
FEI | Added: 4 Jul 2013
FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…
![Hitachi announces the SU8200 – a new type of cold field emitter SEM](/files/img_cache/4584/160_120_1SU8200_%281%29.jpg?1463133885)
Hitachi launches SU8200 series
Hitachi High Technologies | Added: 27 Jun 2013
Hitachi High-Technologies has released the innovative SU8200 series of cold field emitter SEMs worl…
![Hitatchi TM3030](/files/img_cache/4514/160_120_1TM3030.jpg?1456223425)
Hitachi launches table-top microscope
Hitachi High Technologies | Added: 31 May 2013
The 3rd generation TM3030 microscope is designed to provide better resolution when imaging at 5 kV.
![Image](/files/img_cache/3859/160_120_151753_web.jpg?1456223406)
Scientists discover structure of protein essential for quality control
Added: 15 Jan 2013
The Scripps Research Institute (TSRI) has pushed the boundaries of electron microscopy to determine…
![](/files/img_cache/160_120_1LabTalk-no-image.png?1456223416)
Microscopy of Arabidopsis thaliana root tips cells
Leica Microsytems | Added: 19 Dec 2012
This technical note describes the preparation method for electron microscopy of high pressure subst…
Diamond-like coating improves electron microscope images
Added: 18 Dec 2012
Researchers have found that coating materials with diamond-like crystals greatly improves images of…
![](/files/img_cache/160_120_1LabTalk-no-image.png?1456223416)
Scanning Electron Microscopy applied to porous materials
Jeol USA | Added: 31 Oct 2012
This document provides an appraisal of high resolution Scanning Electron Microscopy applied to poro…
![Image](/files/img_cache/3078/160_120_1FEI-Verios-460L-RV-600p.jpg?1456223416)
Verios SEM delivers high resolution measurement
FEI | Added: 31 Jul 2012
SEM allows measurement of sensitive materials in semiconductor and materials applications.
![Image](/files/img_cache/2975/160_120_1Untitled.png?1456223419)
NeoScope microscope delivers improved magnification
Jeol USA | Added: 12 Jul 2012
Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.
![Image](/files/img_cache/2813/160_120_17800Finstrument_copy.jpg?1463133885)
Ultra-high resolution analytical field emission SEM
Jeol USA | Added: 5 Jun 2012
High performance FE-SEM optimised for sub-nm resolution imaging of any type of sample
![XFlash 6](/files/img_cache/2593/160_120_1XFlash_6.jpg?1463133885)
Bruker's next generation EDS detectors
Bruker Nano Analytics | Added: 26 Apr 2012
Bruker has introduced XFlash 6, the next generation of silicon drift detectors (SDD) for energy dis…
![](/files/img_cache/160_120_1LabTalk-no-image.png?1456223416)
Agilent's 'first-of-a-kind' ICP-MS device
Agilent Technologies | Added: 24 Jan 2012
Agilent says its 8800 triple quadrupole ICP-MS (ICP-QQQ) is the first such instrument.
![](/files/img_cache/1727/160_120_1401496_1.jpeg?1456223403)
Asylum AFMs perform advanced measurements
Asylum Research | Added: 25 Oct 2011
Asylum Research provides its MFP-3D and Cypher atomic force microscopes (AFMs) with capabilities th…
![](/files/img_cache/1743/160_120_1401558_1.jpeg?1456223412)
FEI offers mudlogging analysis for oil industry
FEI | Added: 20 Oct 2011
The Qemscan Wellsite analysis system from FEI is suitable for mudlogging services for the oils and …
![](/files/img_cache/160_120_1LabTalk-no-image.png?1456223416)
Elliot offers microscope for forensic scientists
Elliot Scientific | Added: 5 Sep 2011
Elliot Scientific is now offering the Elixir microscope from Craic Technologies for the accurate an…
![](/files/img_cache/160_120_1LabTalk-no-image.png?1456223416)
HT7700 allows analysis of light element materials
Hitachi High Technologies | Added: 18 Aug 2011
Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first t…