All Electron microscopy systems
Jeol TEM rapidly resumes operation after flashing
Jeol USA | Added: 11 May 2011
Jeol's JEM-ARM200F atomic resolution transmission electron microscope (TEM) is claimed to set a new…
Chemistem enables atomic-level spectroscopy
FEI | Added: 6 May 2011
FEI is extending its Chemistem technology to enable atomic-level energy dispersive X-ray (EDX) spec…
Cypher AFM achieves atomic-scale point defects
Asylum Research | Added: 3 May 2011
Asylum Research has announced that its Cypher AFM is routinely achieving resolution of atomic-scale…
Specimen-cleaning chamber for electron microscopy
XEI Scientific | Added: 26 Apr 2011
XEI Scientific has launched its new Softclean specimen-cleaning chamber to be used with the Evactro…
Device cleans carbon contamination with hydrogen
XEI Scientific | Added: 6 Apr 2011
XEI Scientific, maker of the Evactron Plasma Cleaning System for electron microscopes and other vac…
Nanowizard 3 AFM system for imaging applications
JPK Instruments | Added: 24 Mar 2011
JPK Instruments has launched the Nanowizard 3 Nanoscience AFM system, which is designed to provide …
SPM technique probes electrochemical reactivity
Asylum Research | Added: 16 Mar 2011
Asylum Research has announced the Electrochemical Strain Microscopy (ESM) imaging technique for its…
AFMs enable characterisation of optical systems
JPK Instruments | Added: 16 Mar 2011
JPK Instruments reports on the work from the Light Technology Institute at the Karlsruhe Institute …
Electrochemistry cell for use with AFM microscope
Asylum Research | Added: 11 Mar 2011
Asylum Research has produced the Electrochemistry (EC) Cell, for use with its MFP-3D Atomic Force M…
Asylum announces Cypher AFM tour dates
Asylum Research | Added: 4 Mar 2011
Asylum Research, a scanning probe and atomic force microscopy (SPM/AFM) specialist, has announced t…
Desktop SEM provides 45,000x magnification
Phenom-World | Added: 2 Mar 2011
Phenom-World has launched the second generation of desktop scanning electron microscopes (SEMs), th…
Natural gas extraction in shale reservoirs
FEI | Added: 15 Feb 2011
FEI has launched the Helios Nanolab Dualbeam system for analysing the production characteristics an…
Asylum hosts atomic force microscopy workshop
Asylum Research | Added: 2 Feb 2011
The Birck Nanotechnology Center (BNC) at Purdue University, in conjunction with Asylum Research, wi…
AFM tutorial teaches multifrequency techniques
Asylum Research | Added: 28 Jan 2011
Asylum Research is offering a Bimodal AFM tutorial on 13 March 2011, in conjunction with the third …
FEI wins microscope order from Canada laboratory
FEI | Added: 5 Jan 2011
CANMET Materials Technology Laboratory (CANMET-MTL), a research centre funded by the Canadian gover…
Dual AFMs used to probe fluid-surface interactions
Asylum Research | Added: 8 Dec 2010
Asylum Research has installed a dual-system order for a Cypher AFM and MFP-3D-SA AFM at the Cluster…
Extreme-resolution SEM for fragile life sciences
FEI | Added: 8 Dec 2010
FEI has announced the Magellan, an extreme-resolution scanning electron microscope (SEM) that allow…
EM sample cleaner simplifies imaging and analysis
Hitachi High Technologies | Added: 3 Dec 2010
The Zonesem desktop electron microscope (EM) sample cleaner from Hitachi High-Technologies is desig…
SEM sample preparation for electron microscopy
Agar Scientific | Added: 30 Nov 2010
Agar Scientific has introduced the 1060 SEM Mill from Fischione Instruments, designed to provide ta…
Symposium focuses on SPM and optical tweezers
JPK Instruments | Added: 16 Nov 2010
JPK Instruments has hosted the ninth annual international symposium on the applications of scanning…
