All Electron microscopy systems
Cancer research institute selects Jeol microscope
Jeol USA | Added: 27 Oct 2010
Jeol has revealed that the David H Koch Institute for Integrative Cancer Research has selected the …
University tour focuses on Cypher AFM capabilities
Asylum Research | Added: 19 Oct 2010
Scanning probe and atomic force microscopy specialist Asylum Research will be touring the UK and Ir…
Interface connects light and electron microscopes
Carl Zeiss MicroImaging | Added: 18 Oct 2010
Carl Zeiss has introduced Shuttle and Find, an integrated hardware/software interface that connects…
FEI releases new guide to electron microscopy
FEI | Added: 15 Oct 2010
FEI has announced the availability of 'An introduction to electron microscopy', a new edition of it…
Cleaning system for electron microscopy tasks
Agar Scientific | Added: 6 Oct 2010
Agar Scientific has launched the 1070 Nanoclean system from Fischione Instruments that quickly and …
AFM enables imaging/detection of biomolecules
Asylum Research | Added: 27 Sep 2010
Asylum Research has delivered the Cypher atomic force microscope (AFM) to the Instituto Microelectr…
Joel microscope offers multi-touch-screen feature
Jeol USA | Added: 23 Sep 2010
Jeol introduces the Intouchscope, an analytical, low-vacuum scanning electron microscope (SEM) with…
NIST orders atomic-resolution microscope from Jeol
Jeol USA | Added: 21 Sep 2010
The National Institute of Standards and Technology (NIST) has ordered an analytical transmission el…
Workshop to focus on atomic force microscopy
Asylum Research | Added: 10 Sep 2010
Asylum Research and Harvard University's Center for Nanoscale Systems (CNS) will conduct a free wor…
Jeol TEMs to expand electron microscopy core
Jeol USA | Added: 6 Sep 2010
Jeol USA has announced that Emory University in Atlanta, Georgia, US, has selected two Jeol transmi…
Asylum supplies AFMs to Melbourne University
Asylum Research | Added: 1 Sep 2010
Asylum Research, a specialist in scanning probe microscopy/atomic force microscopy (SPM/AFM), has d…
Microscope enables high magnification navigation
Hitachi High Technologies | Added: 31 Aug 2010
The SU8040 Field Emission Scanning Electron Microscope (FE-SEM) from Hitachi features a Regulus (Re…
Jeol SEM can image magnetic materials
Jeol USA | Added: 27 Aug 2010
Jeol has introduced a scanning electron microscope (SEM) with optics that enable ultra-high resolut…
Clairscope utilises electron and light microscopy
Jeol USA | Added: 20 Aug 2010
Jeol USA has revealed the Clairscope has the ability to examine biological samples with both electr…
Transmission electron microscope for pharma R+D
Hitachi High Technologies | Added: 5 Aug 2010
Hitachi High Technologies has launched the HT7700 120kV transmission electron microscope designed f…
High-resolution SEM for wide range of materials
FEI | Added: 3 Aug 2010
FEI has launched the Nova NanoSEM 50 series of ultra-high-resolution scanning electron microscopes …
Software packages enhance electron microscopes
FEI | Added: 3 Aug 2010
FEI has released a set of software applications that increase the throughput and ease of use of its…
Software expands Phenom microscope functionality
Phenom-World | Added: 22 Jul 2010
Phenom-World's new Phenom Pro Suite software product expands the functionality of the Phenom deskto…
Jeol offers optional cold FEG for ARM200F TEM
Jeol USA | Added: 21 Jul 2010
Electron optical equipment and instrumentation provider Jeol USA has launched a cold field-emission…
SEM images hydrated samples in life-sciences labs
Hitachi High Technologies | Added: 19 Jul 2010
Hitachi has launched the SU1510 variable-pressure scanning electron microscope (SEM) designed to im…
