Latest Product Update

The Tecnai Femto is the first system to commercialise patented ultrafast electron microscopy technol

Ultrafast electron microscope

FEI | Added: 14 Nov 2013

FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…

ExSolve is designed to offer an automated, high-throughput sample preparation workflow for transmiss

High-throughput microscopy sample preparation

FEI | Added: 13 Nov 2013

ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…

The Helios NanoLab 660 DualBeam system

FEI to showcase Helios NanoLab 660

FEI | Added: 4 Jul 2013

FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…

Hitachi announces the SU8200 – a new type of cold field emitter SEM

Hitachi launches SU8200 series

Hitachi High Technologies | Added: 27 Jun 2013

Hitachi High-Technologies has released the innovative SU8200 series of cold field emitter SEMs worl…

Hitatchi TM3030

Hitachi launches table-top microscope

Hitachi High Technologies | Added: 31 May 2013

The 3rd generation TM3030 microscope is designed to provide better resolution when imaging at 5 kV.


Verios SEM delivers high resolution measurement

FEI | Added: 31 Jul 2012

SEM allows measurement of sensitive materials in semiconductor and materials applications.


NeoScope microscope delivers improved magnification

Jeol USA | Added: 12 Jul 2012

Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.


Ultra-high resolution analytical field emission SEM

Jeol USA | Added: 5 Jun 2012

High performance FE-SEM optimised for sub-nm resolution imaging of any type of sample

XFlash 6

Bruker's next generation EDS detectors

Bruker Nano Analytics | Added: 26 Apr 2012

Bruker has introduced XFlash 6, the next generation of silicon drift detectors (SDD) for energy dis…

Agilent's 'first-of-a-kind' ICP-MS device

Agilent Technologies | Added: 24 Jan 2012

Agilent says its 8800 triple quadrupole ICP-MS (ICP-QQQ) is the first such instrument.

Asylum AFMs perform advanced measurements

Asylum Research | Added: 25 Oct 2011

Asylum Research provides its MFP-3D and Cypher atomic force microscopes (AFMs) with capabilities th…

FEI offers mudlogging analysis for oil industry

FEI | Added: 20 Oct 2011

The Qemscan Wellsite analysis system from FEI is suitable for mudlogging services for the oils and …

Elliot offers microscope for forensic scientists

Elliot Scientific | Added: 5 Sep 2011

Elliot Scientific is now offering the Elixir microscope from Craic Technologies for the accurate an…

HT7700 allows analysis of light element materials

Hitachi High Technologies | Added: 18 Aug 2011

Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first t…

FEI expands Titan G2 series of microscopes

FEI | Added: 12 Aug 2011

FEI has released the Titan G2 80-200 with Chemistem technology, the latest addition to the Titan G2…

System enables 3D imaging on various sample types

FEI | Added: 10 Aug 2011

FEI has released the Versa 3D Dualbeam system, which enables high-resolution 3D imaging and analysi…

Nanoporous membranes are very thin and permeable

Agar Scientific | Added: 2 Aug 2011

Agar Scientific has introduced new products from the Simpore range of precision membranes for elect…

System enables control of plasma radical sources

XEI Scientific | Added: 25 Jul 2011

XEI Scientific's new Evactron Combiclean system simplifies the control and operation of plasma radi…

Hitachi launches scanning electron microscopes

Hitachi High Technologies | Added: 21 Jul 2011

Hitachi High Technologies has launched the SU8000 range of ultra-high-resolution field-emission sca…

Jeol TEM suited to high-throughput nano-analysis

Jeol USA | Added: 15 Jul 2011

The JEM-2800 from Jeol is a 200kV transmission electron microscope that delivers high-throughput na…