Latest Product Update
Natural gas extraction in shale reservoirs
FEI | Added: 15 Feb 2011
FEI has launched the Helios Nanolab Dualbeam system for analysing the production characteristics an…
Asylum hosts atomic force microscopy workshop
Asylum Research | Added: 2 Feb 2011
The Birck Nanotechnology Center (BNC) at Purdue University, in conjunction with Asylum Research, wi…
AFM tutorial teaches multifrequency techniques
Asylum Research | Added: 28 Jan 2011
Asylum Research is offering a Bimodal AFM tutorial on 13 March 2011, in conjunction with the third …
Extreme-resolution SEM for fragile life sciences
FEI | Added: 8 Dec 2010
FEI has announced the Magellan, an extreme-resolution scanning electron microscope (SEM) that allow…
EM sample cleaner simplifies imaging and analysis
Hitachi High Technologies | Added: 3 Dec 2010
The Zonesem desktop electron microscope (EM) sample cleaner from Hitachi High-Technologies is desig…
SEM sample preparation for electron microscopy
Agar Scientific | Added: 30 Nov 2010
Agar Scientific has introduced the 1060 SEM Mill from Fischione Instruments, designed to provide ta…
University tour focuses on Cypher AFM capabilities
Asylum Research | Added: 19 Oct 2010
Scanning probe and atomic force microscopy specialist Asylum Research will be touring the UK and Ir…
Interface connects light and electron microscopes
Carl Zeiss MicroImaging | Added: 18 Oct 2010
Carl Zeiss has introduced Shuttle and Find, an integrated hardware/software interface that connects…
FEI releases new guide to electron microscopy
FEI | Added: 15 Oct 2010
FEI has announced the availability of 'An introduction to electron microscopy', a new edition of it…
Cleaning system for electron microscopy tasks
Agar Scientific | Added: 6 Oct 2010
Agar Scientific has launched the 1070 Nanoclean system from Fischione Instruments that quickly and …
Joel microscope offers multi-touch-screen feature
Jeol USA | Added: 23 Sep 2010
Jeol introduces the Intouchscope, an analytical, low-vacuum scanning electron microscope (SEM) with…
Microscope enables high magnification navigation
Hitachi High Technologies | Added: 31 Aug 2010
The SU8040 Field Emission Scanning Electron Microscope (FE-SEM) from Hitachi features a Regulus (Re…
Jeol SEM can image magnetic materials
Jeol USA | Added: 27 Aug 2010
Jeol has introduced a scanning electron microscope (SEM) with optics that enable ultra-high resolut…
Clairscope utilises electron and light microscopy
Jeol USA | Added: 20 Aug 2010
Jeol USA has revealed the Clairscope has the ability to examine biological samples with both electr…
Transmission electron microscope for pharma R+D
Hitachi High Technologies | Added: 5 Aug 2010
Hitachi High Technologies has launched the HT7700 120kV transmission electron microscope designed f…
High-resolution SEM for wide range of materials
FEI | Added: 3 Aug 2010
FEI has launched the Nova NanoSEM 50 series of ultra-high-resolution scanning electron microscopes …
Software packages enhance electron microscopes
FEI | Added: 3 Aug 2010
FEI has released a set of software applications that increase the throughput and ease of use of its…
Software expands Phenom microscope functionality
Phenom-World | Added: 22 Jul 2010
Phenom-World's new Phenom Pro Suite software product expands the functionality of the Phenom deskto…
Jeol offers optional cold FEG for ARM200F TEM
Jeol USA | Added: 21 Jul 2010
Electron optical equipment and instrumentation provider Jeol USA has launched a cold field-emission…
SEM images hydrated samples in life-sciences labs
Hitachi High Technologies | Added: 19 Jul 2010
Hitachi has launched the SU1510 variable-pressure scanning electron microscope (SEM) designed to im…
